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References

References are grouped by the concept they support. A citation explains a model or convention; it does not by itself validate SPM-Kit's implementation or a particular experiment.

AFM and operating principles

  1. G. Binnig, C. F. Quate, and Ch. Gerber, “Atomic Force Microscope,” Physical Review Letters 56, 930–933 (1986), doi:10.1103/PhysRevLett.56.930.
  2. F. J. Giessibl, “Advances in atomic force microscopy,” Reviews of Modern Physics 75, 949–983 (2003), doi:10.1103/RevModPhys.75.949.

Contact and force spectroscopy

  1. I. N. Sneddon, “The relation between load and penetration in the axisymmetric Boussinesq problem for a punch of arbitrary profile,” International Journal of Engineering Science 3, 47–57 (1965), doi:10.1016/0020-7225(65)90019-4.
  2. K. L. Johnson, K. Kendall, and A. D. Roberts, “Surface energy and the contact of elastic solids,” Proceedings of the Royal Society A 324, 301–313 (1971), doi:10.1098/rspa.1971.0141.
  3. B. V. Derjaguin, V. M. Muller, and Y. P. Toporov, “Effect of contact deformations on the adhesion of particles,” Journal of Colloid and Interface Science 53, 314–326 (1975), doi:10.1016/0021-9797(75)90018-1.
  4. J. L. Hutter and J. Bechhoefer, “Calibration of atomic-force microscope tips,” Review of Scientific Instruments 64, 1868–1873 (1993), doi:10.1063/1.1143970.

KPFM

  1. M. Nonnenmacher, M. P. O’Boyle, and H. K. Wickramasinghe, “Kelvin probe force microscopy,” Applied Physics Letters 58, 2921–2923 (1991), doi:10.1063/1.105227.

Surface texture and spectra

  1. ISO 25178-2:2021, Geometrical product specifications (GPS)—Surface texture: Areal—Part 2: Terms, definitions and surface texture parameters, ISO catalogue record.
  2. T. D. B. Jacobs, T. Junge, and L. Pastewka, “Quantitative characterization of surface topography using spectral analysis,” Surface Topography: Metrology and Properties 5, 013001 (2017), doi:10.1088/2051-672X/aa51f8.
  3. D. Nečas and P. Klapetek, “Gwyddion: an open-source software for SPM data analysis,” Central European Journal of Physics 10, 181–188 (2012), doi:10.2478/s11534-011-0096-2.

Authoritative software and project records

  1. Gwyddion developers, Gwyddion User Guide, including leveling, statistical analysis, Fourier analysis, and calibration.
  2. SPM-Kit, source repository and scientific status matrix.
  3. SPM-Kit Validation, retained campaign repository.

Glossary · Theory overview